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Residual effect of silicon and sulphur fertilization on growth and yield of wheat under rice-wheat cropping sequence

DOI: 10.31830/2454-1761.2019.011    | Article Id: 002 | Page : 65-69
Citation :- Residual effect of silicon and sulphur fertilization on growth and yield of wheat under rice-wheat cropping sequence. Crop Res. 54: 65-69
Vimal N. Patel, K. C. Patel, V. P. Parmar vn9101@gmail.com
Address : Department of Soil Science and Agricultural Chemistry, Anand Agricultural University, Anand-388 110 (Gujarat), India

Abstract

The field experiment was conducted on effect of silicon and sulphur on yield and chemical composition on rice and its residual effect on wheat in loamy sand soil during the kharif and rabi seasons for two years 2016–17 and 2017–18 at Regional Research Station Farm, Anand Agricultural University, Anand (Gujarat). The experiment was laid out in randomized block design with factorial concept, comprising 12 treatment combinations of four levels of silicon (Si) (0, 150, 300 and 450 kg/ha) and three levels of sulphur (S) (0, 20 and 40 kg/ha) with three replications and were applied to rice as a basal along with recommended dose of fertilizer (120: 40: 00 kg NPK/ha) and the residual effect of treatments was studied in wheat crop. Residual effect of applied Si @ 450 kg/ha along with S @ 40 kg/ha significantly increased the number of tillers per meter in row length, plant height, grain and straw yields of wheat over control. But it was at par with 300 kg Si/ha along with 20 kg S/ha in case of number of tillers per meter in row length, plant height and it was at par with 300 and 150 kg Si/ha in case of grain and straw yields of wheat.

Keywords

Cropping sequence  rice  silicon  sulphur  wheat and straw yield.

References

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